Fachbereich Physik


Navigation und Suche der Universität Osnabrück


Hauptinhalt

Topinformationen

Publikationen

2016
112. 

F. Timmer, R.Oelke, C. Dues, S. Sanna, W. G. Schmidt, M. Franz, S. Appenfeller, M. Dähne, J. Wollschläger

Strain-induced quasi-one-dimensional rare-earth silicide structures on Si(111)

Phys. Rev. B 94, 205431 Published 28 November 2016

111.

O. Kuschel, R. Buß, W. Spiess, T. Schemme, J. Wöllermann, K. Balinski, A. T. N'Diaye, T. Kuschel, J. Wollschläger and K. Kuepper

From Fe3O4/NiO bilayers to NiFe2O4-like thin films through Ni interdiffusion

Phys. Rev. B94, 094423 Published 20 September 2016

110.

K. Kuepper, O. Kuschel, N. Pathe, T. Schemme, J. Schmalhorst, A. Thomas, E. Arenholz, M. Gorgoi, R. Ovsyannikov, S. Bartkowski, G. Reiss, J. Wollschläger

Electronic and magnetic structure of epitaxial Fe3O4(001)/NiO heterostructures grown on MgO(001) and Nb-doped SrTiO3(001)

Phys. Rev. B 94, 024401 Published 1 July 2016

109.

C. Klewe, T. Kuschel, J.-M. Schmalhorst, F. Bertram, O. Kuschel, J. Wollschläger, J. Strempfer, M. Meinert, G. Reiss

Static magnetic proximity effect in Pt/Ni1-x Fex bilayers investigated by x-ray resonant magnetic reflectivity

Phys. Rev. B 93, 214440 Published 30 June 2016

108.

S. Sanna, C. Dues, W. Schmidt, F. Timmer, J. Wollschläger, M. Franz, S. Appelfeller, M.Dähne

Rare-earth silicide thin films on the Si(111) surface

Phys. Rev. B 93, 195407 Published 6 May 2016

107.

L. Schneider, J. Wollschläger, HJ. Steinhoff, M. Haase, K. Kuepper et al.

Characterization of multifunctional β-NaEuF4/NaGdF4 core-shell nanoparticles with narrow size distribution

Nanoscale (2016, 8, 2832)

106.

T. Nordmann, O. Kuschel, J. Wollschläger

Epitaxial growth of ultrathin MgO layers on Fe3O4 (001) films

Appl. Surf. Sci. 381, 28 (February, 2016)

105.

J. Wollschläger, T. Schemme, O. Kuschel, M. Witziok, T. Kuschel, K. Kuepper

Structural, magnetic and magneto optical properties of Fe3O4/NiO bilayers on MgO(001)

Proc. SPIE 9749, Oxide-based Materials and Devices VII, 974917 (February 27, 2016)

104.

T. Kuschel, C. Klewe, P. Bougiatioti, O. Kuschel, J. Wollschläger, L. Bouchenoire, S. D. Brown., J.-M. Schmalhorst, D. Meier,  G. Reiss

Static Magnetic Proximity Effect in Pt Layers on Sputter-Deposited NiFe2O4 and on Fe of Various Thicknesses Investigated by XRMR

IEEE Trans. Magn. 52, 4500104 (2016)

2015
103.

H. Schäfer, K. Küpper, J. Wollschläger et al.

Oxidized Mild Steel S235: An Efficient Anode for Electrocatalytically Initiated Water Splitting

ChemSusChem, Volume 8, Issue 18, (2015), 3099–3110

102.

G. Niu, T. Schroeder, M. Bäumer, J. Wollschläger, M. Reichling, et al.

Controlling the physics and chemnistry of binary and ternary praseodymium and cerium oxide systems

Phys. Chem. Chem. Phys., 2015, 17, 24513-24540

101.

T. Schemme, A. Krampf, F. Bertram, T. Kuschel, K. Kuepper, J. Wollschläger

Modifying magnetic properties of ultra-thin magnetite films by growth on Fe pre-covered MgO(001)

J. Appl. Phys. 118, 113904 (2015)

100.

O. Kuschel, F. Diek, H. Wilkens, T. Schroeder, J. Wollschläger et al.

Plasma Enhanced Complete Oxidation of Ultrathin Epitaxial Praseodymia Films on Si(111)

Materials (2015) 8 6379-6390

99.

T. Schemme, O. Kuschel, F. Bertram, K. Kuepper, J. Wollschläger

Structure and morphology of epitaxially grown Fe3O4/NiO bilayers on MgO(001)

Thin Solid Films, Volume 589, Pages 526 - 533, (2015)

98.

T.Kuschel, F. Bertram, O. Kuschel, T. Schemme, J. Wollschläger,  D. Meier, G. Reiss, et al.

Static Magnetic Proximity Effect in Pt / Ni Fe2O4 and Pt / Fe Bilayers Investigated by X-Ray Resonant Magnetic Reflectivity

Phys. Rev. Lett. 115, 097401 (2015)

97.

A. Thomas, S. Niehorster, S. Fabretti, O. Kuschel, K. Kuepper, J. Wollschläger et al.

Tunnel junction based memristors as artificial synapses

Front. Neurosci.

96.

H. Wilkens, W. Spieß, M. H. Zoellner, G. Niu, T. Schroeder, J. Wollschläger

Post deposition annealing of epitaxial Ce1-xPrx O2-δ films grown on Si(111)

Phys. Chem. Chem. Phys. 17 (2015) 9991

95.

L. Marnitz, K. Kuepper, J. Wollschläger, A. Thomas, G. Reiss, T.Kuschel, et al.

Sign change in the tunnel magnetoresistance of Fe3O4/MgO/Co-Fe-B magnetic tunnel junctions deppending on the annealing temperature and the interface treatment

AIP Advances 5, 047103 (2015)

94.

Helmut Schäfer, Lorenz Walder, Joachim Wollschlaeger, Olga Kuschel, Karsten Küpper, Lilly Schneider, et al.

Surface Oxidation of Stainless Steel: Oxygen Evolution Electrocatalysts with High Catalytic Activity

CS Catalysis 2015, 5, pp 2671–2680

93.

T. Lichtenstein, H. Teiken, H. Pfnür, J. Wollschläger, C. Tegenkamp

Au-chains grown on Ge(100): A detailed SPA-LEED study

Surf. Sci. 632 (2015) 64. 

2014
92.

T. Schemme, N. Pathé, G. Niu, F. Bertram, T. Kuschel, K. Kuepper, J. Wollschlaeger

Magnetic anisotropy related to strain and thickness of ultrathin iron oxide films on MgO(001)

Mater. Res. Express 2, 016101 (2015)

91.

D. Bruns, I. Kiesel, S. Jentsch, S. Lindemann, C. Otte, T. Schemme, T. Kuschel, J. Wollschlaeger

Structural analysis of FeO(111)/Ag(001): undulation of hexagonal oxide monolayers due to square lattice metal substrates

Journal of Physics: Condensed Matter 26 (2014) 315001

90.

R.Olbrich, H. H. Pieper, R. Oelke, H. Wilkens, J. Wollschläger, M. H. Zoellner, T. Schroeder and M. Reichling

A well-structured metastable ceria surface

Appl. Phys. Lett. 104, 081910 (2014)

89.

I. Flege, B. Kaemena, J. Hoecker, F. Bertram, J. Wollschlaeger, T. Schmidt, J. Falta

Ultrathin, epitaxial cerium dioxide on silicon

Appl. Phys. Lett.104, (2014) 131604

88.

H. Wilkens, S. Gevers, S.Röhe, A. Schaefer, M. Bäumer, M. H. Zoellner, T. Schroeder and J. Wollschläger

Structural Changes of Ultrathin Cub-PrO2(111)/Si(111) Films Due to Thermally Induced Oxygen Desorption

J. Phys. Chem. C, 2014, 118 (6), pp 3056-3061

2013
87.

H. Wilkens, O. Schuckmann, M. Reichling, M. Bäumer, G. Niu, T. Schroeder, J. Wollschläger, et al.

Structural transitions of epitaxial ceria films on Si(111)

Phys. Chem. Chem. Phys., (2013) 15, 18589-18599

86.

D. Bruns, S. R. Lindemann, K. Kuepper, T. Schemme, J. Wollschläger

Fe3O4 films on Ag(001)-Generation of high-quality epitaxial ferrimagnetic metal oxide films

Appl. Phys. Lett.103, (2013) 052401

85.

F. Bertram, C. Deiter, T. Schemme, S. Jentsch, J. Wollschläger

Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)

J. Appl. Phys. 113 (2013) 184103

84.

H. Wilkens, J. Rodewald, S. Gevers, M. H. Zoellner, T. Schroeder and J. Wollschläger

Surface morphology of ultrathin hex-Pr2O3 films on Si(111)

J. Phys. D: Appl. Phys. 46 (2013) 285306 (7pp)

83.

H. Wilkens, M. Bäumer, M. H. Zoellner, T. Schroeder and J. Wollschläger, et al.

Stabilization of the ceriaι-phase (Ce7O12) surface on Si(111)

Appl. Phys. Lett. 102 (2013) 111602

2012
82.

T. Kuschel, J. Hamrle,J. Pistora, K. Saito, S. Bosu, Y. Sakuraba, K. Takanashi, J. Wollschläger

Magnetic characterization of thin Co50Fe50 films by magnetooptic Kerr effect

J. Phys. D: Appl. Phys. 45 (2012) 495002

81.

M.H. Zoellner, P. Zaumseil, H. Wilkens, S. Gevers, J. Wollschläger, M. Bäumer, Y.-H. Xie, G. Niu, T. Schröder

Stoichiometry-structure correlation of epitaxial Ce1-xPrxO2-δ (x=0-1) thin films on Si(111)

J. Cryst. Growrh 355 (2012) 159

80.

F. Bertram, C. Deiter, O. Hoefert, T. Schemme, F. Timmer, M. Suendorf, B. Zimmermann, J. Wollschläger

X-ray diffraction study on size effects in epitaxial magnetite thin films on MgO(001)

J. Phys. D: Appl. Phys. 45 (2012) 395302

79.

T. Kuschel, J. Hamrle, J. Pistora, K. Saito, S. Bosu, Y. Sakuraba, K. Takanashi, J. Wollschläger

Magnetization reversal analysis of a thin B2-type ordered Co50Fe50 film by magnetooptic Kerr effect

J. Phys. D: Appl. Phys. 45, (2012) 205001

78.

M. H. Zoellner, H. Wilkens, J. Wollschläger, M.Reichling, M. Bäumer, T. Schroeder, et al.

Stacking behavior of twin-free type-B oriented CeO2(111) films on hexagonal Pr2O3(0001)/Si(111) systems

Phys. Rev. B85 (2012) 035302

2011
77.

J. I. Flege, B. Kaemena, S. Gevers, F. Bertram, T. Wilkens, D. Bruns, J. Wollschläger, J. Falta

Silicate-free growth of high-quality ultra-thin ceria films on Si(111)

Phys. Rev. B84 (2011) 235418

76.

F. Bertram, C. Deiter, K. Pflaum, M. Suendorf, C. Otte, J. Wollschläger

In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ulta-thin iron oxide films

J. Appl. Phys. 110, 102208 (2011)

75.

J. Wollschläger, C. Deiter, C. R. Wang, B. H. Müller, K. R. Hofmann

Surfactant enhanced solid phase epitaxy of Ge/CaF2/Si(111): Synchroton x-ray characterization of structure and morphology

J. Appl. Phys. 110, 102205 (2011)

74.

S. Gevers, T. Weisemoeller, A. Schaefer, V. Zielasek, M. Bäumer, J. Wollschläger

Structure of oxygen-plasma-treated ultrathin praseodymia films on Si(111)

Phys. Rev. B83 (2011) 193408

73.

T. Kuschel, H. Bardenhagen, H. Wilkens, R. Schubert, J. Hamrle, J. Pistora, J. Wollschläger

Vectorial magnetometry using magnetooptic Kerr effect including first- and second-order contributions for thin ferromagnetic films

J. Phys. D: Appl. Phys.44 (2011) 265003)

72.

T. Kuschel, T. Becker, D. Bruns, M. Suendorf, F. Bertram, P. Fumagalli, J. Wollschläger

Uniaxial magnetic anisotropy for thin Co films on glass studied by magnetooptic Kerr effect

J. Appl. Phys. 109, 093907 (2011)

71.

D. Bruns, S. Gevers, J. Wollschläger

Formation and Morphology of Step Bunches during B-Segregation on Si (111)

Surf. Sci. 605 (2011) 861

70.

A. Schaefer, S. Gevers, V. Zielasek, J. Wollschläger, et al.

Photoemission study of praseodymia in its highest oxidation state: The necessity of in situ plasma treatment

Journal of Chemical Physics Volume: 134 Issue: 5 Article Number: 054701

69.

S. Gevers, T. Weisemoeller, D. Bruns, A. Giussani, T. Schroeder, J. Wollschläger

Post deposition annealing of praseodymia films on Si(111) at low temperatures

J. Phys.: Condens. Matter 23 (2011) 115904

2010
68.

A. Moses Ezhil Raj, J. Wollschlaeger, M. Suendorf, M. Neumann, et al.

Spray deposition and property analysis of anatase phase titnia (TiO2) nanostructures

Thin Solid Films 519, 129 (2010)

67.

S. Gevers, J. I. Flege, B. Kaemena, D. Bruns, T. Weisemoeller, J. Falta, J. Wollschläger

Improved epitaxy of ultrathin praseodymia films on chlorine passivated Si(111) reducing silicate interface formation

Appl. Phys. Lett. 97, 242901 (2010)

66.

Deiter, M. Bierkandt, A. Klust, et al.

Structural transitions and relaxation processes during the epitaxial growth of ultrathin CaF2 films on Si(111)

Phys. Rev. B82 (2009) 085449

65.

Raj, A. Moses Ezhil, Victoria, S. Grace, M. Suendorf, M. Neumann, J. Wollschläger, et al.

XRD and XPS characterization of mixed valence Mn3O4 hausmannite thin films prepared by chemical spray pyrolysis technique

Appl. Surf. Sci. 256 (2010)

64.

S. Gevers, T. Weisemoeller, B. Zimmermann, C. Deiter, J. Wollschlaeger

Structure and stability of cub- Pr2O3 films on Si(111) under post deposition annealing conditions

Physica Status Solidi (c) Vol. 7

2009
63.

S. Gevers, T. Weisemoeller, B. Zimmermann, F. Bertram, C. Deiter, J. Wollschlaeger

Structual phase transition of ultra thin PrO2 films on Si(111)

J.Phys.: Condens.Matter (21) 2009 175408

62.

A. Giussani, P. Zaumseil, J. Wollschlaeger, T. Schroeder, et al.

Defect structure of Ge(111)/cubic Pr2O3(111)/ Si(111) heterostructure: Thikness and annealing dependence

J. Appl. Phys. 106, 073502 (2009)

61.

G. Jnawali, C. Deiter, T. Weisemoeller, F. Bertram, J. Wollschlaeger, R. Möller, M. Horn-von Hoegen, et  al.

Epitaxial Growth of Bi(111) on Si(001)

 e-J. Surf. Sci. Nanotech. Vol. 7 (2009) 441-447

60.

A. Schaefer, V. Zielasek, J. Wollschläger, T. Schroeder, J. Falta, M. Bäumer

Growth of praseodymium oxid on Si(111) under oxygen-deficient conditions

Phys. Rev. B80 (2009) 045414.

59.

T. Weisemoeller, F. Bertram, S. Gevers, C. Deiter, A. Greuling, J. Wollschläger

Effect of amorphous interface layers on crystalline thin-film x-ray diffraction

Phys. Rev. B79 (2009) 045414.

58.

T. Weisemoeller, F. Bertram, S. Gevers, C. Deiter, A. Greuling, J. Wollschläger, et  al.

Postdeposition annealing induced transition from hexagonal Pr2O3 to cubic PrO2 films on Si(111)

J. Appl. Phys. 105, 124108 (2009)

57.

A. Giussani, P. Zaumseil, J. Wollschlaeger, T. Schroeder, et al.

Atomically smooth and single Crystalline Ge(111)/cubic Pr2O3(111)/ Si(111) heterostructure: Structural and chemical composition study

J. Appl. Phys. 105, 033512 (2009)

2008
56.

T. Weisemoeller, C. Deiter, F. Bertram, S. Gevers, A. Guissani, P. Zaumseil, T. Schroeder, J. Wollschlaeger

Epitaxy of single crystalline PrO2 films on Si(111)

 Appl. Phys. Lett. 93 (2008) 032905

55.

A. Giussani, P. Zaumseil, T. Weisemoeller, C. Deiter, J. Wollschlaeger, P. Storck, T. Schroeder, et al.

The influence of lattice oxygen on the initial growth behavior of heteroepitaxial Ge layers on single crytalline PrO2(111)/Si(111)support systems

J. Appl. Phys. 103, 084110 (2008)

54.

Raj, A. Moses Ezhil, V. Senthilkumar, M. Suendorf, M. Neumann, J. Wollschläger, et al.

Studies on transparent spinel magnesium indium oxide thin films prepared by chemical spray pyrolsis

Thin Solid Films 517 (2008)

2007
53.

E.P. Rugeramigabo, C. Deiter, J. Wollschläger

Solid phase epitaxy of Ge films on CaF2/Si(111)

Appl. Surf. Sci. 254 (2007)

52.

J. Wollschläger, C. Tegenkamp

Diffraction from disordered vicinal surfaces with alternating terraces

Phys. Rev. B75 (2007) 245439

2006
51.

J. Wollschläger, C. Deiter, M. Bierkandt, A. Gerdes, M. Bäumer, C.R. Wang, B.H. Müller, K.R. Hofmann

Homogeneous Si films on CaF2lSi(111) due to boron enhanced solid epitaxy

Surf. Sci. 600 (2006) 3637-3641

50.

T. Nowitzki, P. Nickut, C. Deiter, J. Wollschläger, K. Al-Shamery, M. Bäumer

Au deposits on graphite: On the nature of high temperature desorption spectra

Surf. Sci. 600 (2006) 3595-3599

49.

A. Klust, T. Ohta, M. Bierkandt, C. Deiter, Q. Yu, J. Wollschläger, F.S. Ohuchi, M.A. Olmstead

Contrast in Scanning Probe Microscopy Images of Ultra-Thin Insulator Films

Appl. Phys. Lett.88 (2006) 063107.

2003
48.

A. Klust, M. Grimsehl, and J. Wollschläger

Interface Reaction Mediated Formation of Two-Dimensional Si Islands on CaF2

Appl. Phys. Lett. 82 (2003) 4483.

47.

J. Wollschläger, M. Bierkandt and M.I. Larsson

Kinetic phase diagram for terrace and step nucleation of CaF/Si (111)

Appl. Surf. Sci. 219 (2003) 107.

46.

B.H. Müller, C.R. Wang, K.R. Hofmann, M. Bierkandt, C. Deiter, and J. Wollschläger

Initial Stages of CaF2/Si(111) Epitaxy Investigated by Friction Force Microscopy

Surf. Sci. 532-535 (2003) 633.

45.

Petkova, J. Wollschläger, H.-L. Günter, and M. Henzler

Deviations from exact epitaxial positions in heteroepitaxy

Surf. Sci. 542 (2003) 211.

2002
44.

J. Wollschläger

Resonant Tunneling Devices Based on Epitaxial Insulator-Semiconductor Structures: Growth and Characterisation of CaF2 Films on Si(111)

in: Recent Research Developments in Applied Physics,  ed. S.G. Pandalai, Vol. 5-II

43.

J. Wollschläger

Substrate Step Induced Effects on the Growth of CaF2 on Si(111)

Appl. Phys. A 75 (2002) 155.

42.

A. Klust, M. Bierkandt, J. Wollschläger, B.H. Müller, Th. Schmidt, and J. Falta

Low Temperature Interface Structure of CaF2/Si(111) Studied by Combining X-Ray Standing Waves with Component-Resolved Photoemission

Phys. Rev. B65 (2002) 193404.

41.

Chr. Tegenkamp, J. Wollschläger, H. Pfnür, and M. Horn-von Hoegen

Step and Kink Correlations on Vicinal Ge(100) Surfaces Investigated by Electron Diffraction

Phys. Rev. B65 (2002) 235316.

2001
40.

A. Petkova, J. Wollschläger, H.L. Günter, and M. Henzler

Formation and Commensurate Analysis of „Incommensurate“ Superstructures of Pb on Si(111)

Surf. Sci. 471 (2001) 11.

39.

J. Wollschläger, D. Erdös, H.Goldbach, R. Höpken, and K.M. Schröder

Growth of NiO and MgO Films on Ag(100)

Thin Solid Films 400 (2001) 1.

38.

A. Petkova, J. Wollschläger, H.L. Günter, and M. Henzler

Order and Disorder in Ultrathin Pb Films Grown on Si(111)7x7 Substrates at Low Temperature

Surf. Sci. 482-485 (2001) 922.

2000
37.

A.A. Saranin, V.G. Lifshits, H. Bethge, R. Kayser, A. Klust, H. Goldbach, J. Wollschläger, and M. Henzler

Restructuring Process of the Si(111) Surface upon Ca Deposition

Surf. Sci. 448 (2000) 87.

36.

J. Wollschläger, Th. Schmidt, M. Henzler, and M.I. Larsson

Determination of Diffusion Energies on fcc(111) Surfaces from Diffraction Experiments: a Monte Carlo Study

Surf. Sci. 454-456 (2000) 566.

35.

A. Klust, R. Kayser, and J. Wollschläger

Growth Kinetics of CaF2 on Si(111) for a Two Step Deposition

Phys. Rev. B62 (2000) 2158.

34.

J. Wollschläger, T. Hildebrandt, R. Kayser, J. Viernow, A. Klust, J. Bätjer, A. Hille, Th. Schmidt, and J. Falta

Effects of Electron Irradiation on the Structure and Morphology of CaF2/Si(111)

Appl. Surf. Sci. 162/163 (2000) 309.

1999
33.

J. Wollschläger, J. Viernow, C. Tegenkamp, D. Erdös, K.M. Schröder, and H. Pfnür

Stoichiometry and Morphology of MgO Films Grown Reactively on Ag(100)

Appl. Surf. Sci. 142 (1999) 129.

32.

C. Tegenkamp, M. Michailov, J. Wollschläger, and H. Pfnür

Growth and Surface Alloy Formation of Mg on Ag(100)

Appl. Surf. Sci. 151 (1999) 40.

31.

A. Petkova, J. Wollschläger, H.L. Günter, and M. Henzler

Formation of Intermediate 3x3 Phase from Pb on Si(111) at High Temperature

J. Phys.: Condens. Matter 11 (1999) 9925.

30.

C. Tegenkamp, J. Wollschläger, M. Henzler, H. Pfnür

Defects in Epitaxial Insulating Thin Films

J. Phys.: Condens. Matter 11 (1999) 9943.

1998
29.

J. Wollschläger

Morpholoy and Defect Characterization of Epitaxial Oxide Films

Defect and Diffusion Forum 164 (1998) 37.

28.

J. Wollschläger and M.I. Larsson

Diffraction from Two-Dimensional Vicinal Surfaces with Non-Colliding Meandering Steps

Phys. Rev. B57(1998) 15541.

27.

J. Wollschläger, E.Z. Luo, and M. Henzler

Epitaxial Films Formed under Stabel and Unstable Growth Conditions: Diffraction Characterization of the Surface Morphology

Phys. Rev. B57 (1998) 14937.

26.

M. Henzler, V. Zielasek, D. Erdös, and J. Wollschläger

Epitaxial Insulating Films

Surf. Rev. and Lett. 5 (1998) 675.

25.

B. Müller, L.P. Nedelmann, B. Fischer, H. Brune, J.V. Barth, K. Kern, D. Erdös, and J. Wollschläger

Strain Relief via Island Ramification in Submonolayer Heteroepitaxy

Surf. Rev. and Lett. 5 (1998) 769.

24.

J. Wollschläger, A. Klust, and H. Pietsch

Inhomogeneous Growth of CaF2 Adlayers on Si(111) at Intermediate Temperatures

Appl. Surf. Sci. 123/124 (1998) 496.

23.

J. Wollschläger, D. Erdös, and K.M. Schröder

The Formation of Mosaics during the Reactive Growth of MgO Films on Ag(100)

Surf. Sci. 402-404 (1998) 272.

22.

J. Wollschläger, H. Pietsch, and A. Klust

Competition between Terrace and Step Nucleation: Epitaxy of CaF2 on Vicinal Si(111) Studied by Atomic Force Microscopy

Appl. Surf. Sci. 130-132 (1998) 29.

21.

Klust, H. Pietsch, and J. Wollschläger

Growth of CaF2 on Si(111): Observation of the CaF-Interface by Friction Force Microcsopy

Appl. Phys. Lett. 73 (1998) 1967.

20.

J. Wollschläger, H. Pietsch, R. Kayser, and A. Klust

Annealing of CaF2 adlayers grown on Si(111): investigations of the morphology by atomic force microscopy

Thin Solid Films 336 (1998) 120.

1997
19.

H. Pietsch, A. Klust, A. Meier, and J. Wollschläger

Growth Instabilities of CaF2 Adlayers Deposited at High Temperature on Si(111)

Surf. Sci. 377-379 (1997) 909.

18.

F. Schäfer, D. Erdös, K.M. Schröder, L. Nedelmann, B. Müller, B. Fischer, K. Kern, M. Henzler, J. Wollschläger

Epitaxial Growth of Mg on Pd(100) and Ag(100): Growth Modes for Complete and Incomplete Adlayer Condensation

in: Surface Diffusion: Atomistic and Collective Processes, ed. M. Tringides, 1997. ISBN-10: 0306456133

17.

L.Nedelmann, B. Müller, B. Fischer, K. Kern, D. Erdös, J. Wollschläger, M. Henzler

A Comparative STM and SPA-LEED Study on the Evolution of Strain Induced Stripe Pattern on Cu/Ni(100)

Surf. Sci. 376 (1997) 113.

16.

M.I. Larsson, H. Frischat, J. Wollschläger, and M. Tringides

Properties of Kinks in Vicinal Face-Centered Cubic (111) Surfaces

Surf. Sci. 381 (1997) 123.

15.

J.Wollschläger

Simple analysis of spot splitting due to diffraction at surfaces with atomic stepping

Surf. Sci. 383 (1997) 103.

14.

M.I. Larsson, M. Tringides, H. Frischat, and J. Wollschläger

Thermal Roughening of Uncorrelated Steps

Surf. Sci. 387 (1997) 142.

13.

J. Wollschläger, F. Schäfer, and K.M. Schröder

Diffraction Spot Profile Analysis for Vicinal Surfaces with Long-Range Order

Surf. Sci. 396 (1997) 94.

1996
12.

J. Wollschläger and A. Meier

Diffraction Spot Profile Analysis for Heteroepitaxial Surfaces Applied to the Initial Growth Stages of CaF2 Adlayers on Si(111)

Appl. Surf. Sci. 104/105 (1996) 392.

11.

J. Wollschläger and A. Meier

Film and Interface Morphology of CaF2 Grown on Si(111) at Low Temperature

J. Appl. Phys. 79 (1996) 7373.

1995
10.

E.Z. Luo, J. Wollschläger, F. Wegner, and M. Henzler

SPA-LEED Studies of Growth of Ag on Ag(111) at Low Temperatures

Appl. Phys. A60 (1995) 19.

9.

J. Wollschläger

Diffraction from Surfaces with Randomly Distributed Structural Defects

Surf. Sci. 328 (1995) 325.

8.

M. Henzler, C. Homann, U. Malaske, and J. Wollschläger

Misfit Accomodation in Heteroepitaxy by Inclined Stacking Faults

Phys. Rev. B52 (1995) R17060.

1994
7.

E.Z. Luo, S. Heun, M. Kennedy, J. Wollschläger, and M. Henzler

Surface Roughness and Conductivity of Thin Ag Films

Phys. Rev. B49 (1994) 4858.

1992
6.

J. Wollschläger and N.M. Amer

Heterogeneous Nucleation and Epitaxial Growth of Au on the Co Decorated Au(111) Surface Investigated by Scanning Tunneling Microscopy

Surf. Sci. 277 (1992) 1.

1991
5.

J. Wollschläger, E.Z. Luo, and M. Henzler

Thermal Roughness of the Homogeneous and Inhomogeneous Cu(311) Surface Studied by High-Resolution Low-Energy Electron Diffraction

Phys. Rev. B44 (1991) 13031.

4.

J. Wollschläger, E.Z. Luo, and M. Henzler

Epitaxial Growth and Thermal Behaviour of Pb Overlayers on Cu(311) Studied by High-Resolution Low-Energy Electron Diffraction

Surf. Sci. 257 (1991) 274.

1990
3.

J. Wollschläger, J. Falta, and M. Henzler

Electron Diffraction at Stepped Homogeneous and Inhomogeneous Surfaces

Appl. Phys. A50 (1990) 57.

2.

G. Meyer, J. Wollschläger, and M. Henzler

Epitaxial Growth of Thin Copper Layers on Cu(111) Studied by High-Resolution Low-Energy Electron Diffraction

Surf. Sci. 231 (1990) 64.

1989
1.

J. Wollschläger and M. Henzler

Defects at the Si(111)/SiO2 Interface Investigated with Low-Energy Electron Diffraction

Phys. Rev. B39 (1989) 6052.