FB6 Mathematik/Informatik/Physik

Institut für Physik


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Publikationen

2025

158.

M. Wortmann, B. Bednarz, N. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst, I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten, T. Kuschel

Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe

Appl. Surf. Sci. 713 (2025) 164356

DOI

157.

A. Usama, E. Schäfer, P. Zhu, Q. Song, A. Weißbach, D. Helmer, J. Wollschläger, C. You, M. Steinhart, P. Pezeshkpour, P. Hou, B. Rapp

Antifouling PEG coatings by thiol-acrylate conjugate addition reactions for generation of protein patterns via photobleaching-induced protein binding (PiPB) biobitmaps using maskless projection lithography

Adv. Mater. Interfaces 12 (2025) 2500198

DOI

2024

156.

A. Alexander, T. Kleideiter, T. Pollenske, K. Ruwisch, F. Bertram, J. Wollschläger

SPA-LEED studies on the growth morphology of ultra-thin Fe3O4 films on Sr3TiO(001)

Appl. Surf. Sci. 684 (2025) 161835

DOI

155.

H. Pfnür, C. Tegenkamp, S. Sanna, E. Jeckelmann, M. Horn-von Hoegen, U. Bovensiepen, N. Esser, W.G. Schmidt, M. Dähne, S. Wippermann, F. Bechstedt, M. Bode, R. Claessen, R. Ernstdorfer, C. Hogan, M. Ligges, A. Pucci, J. Schäfer, E. Speiser, M. Wolf, J. Wollschläger

Atomic wires on substrates: Physics between one and two dimensions

Surf. Sci. Rep. 79 (2024) 100629

DOI

154.

J. Rodewald, J. Thien, K. Ruwisch, T. Pohlmann, M. Hoppe, J.-M. Schmalhorst, K. Küpper, J. Wollschläger

Structure-related electronic and magnetic properties in ultrathin epitaxial NixFe3−xO4 Films on MgO(001)

Nanomaterials 14 (2024) 694

DOI

2023

153.

A. Alexander, T. Pohlmann, M. Hoppe, J. Röh, O. Gutowski, K. Küpper, F. Bertram, J. Wollschläger

Time-resolved high-energy X-ray diffraction studies of ultrathin Ni ferrite films on MgO(001)

J. Appl. Cryst. 56 (2023) 1784

DOI

152.

J. Thien, J. Rodewald, T. Pohlmann, K. Ruwisch, F. Bertram, K. Küpper, J. Wollschläger

Real-time monitoring of strain accumulation and relief during epitaxy of ultrathin Co ferrite films with varied Co content

Materials 16 (2023) 7287

DOI

151.

G. Manoharan, P. Bösel, J. Thien, M. Holtmannspötter, L. Meingast, M. Schmidt, H. Eickmeier, M. Haase, J. Maultzsch, M. Steinhart, J. Wollschläger, M. Palma,
C. Meyer

Click-functionalization of silanized carbon nanotubes: From inorganic heterostructures to biosensing nanohybrids

Molecules 28 (2023) 2161

DOI

150.

F. Alarslan, H. Hübner, J. Klein, K. Küpper, J. Wollschläger, M. Haase, M. Gallei, M. Steinhart

Solvent-free high-temperature capillary stamping of stimuli-responsive polymers: Wettability management by orthogonal substrate functionalization

ACS Appl. Polym. Mater.5 (2023) 5738

DOI

2022

149.

F. Alarslan, M. Frosinn, K. Ruwisch, J. Thien, T. Jähnichen, L. Eckert, J. Klein,
M. Haase, D. Enke, J. Wollschläger, U. Beginn, M. Steinhart

Reactive additive capillary stamping with double network hydrogel-derived aerogel stamps under solvothermal conditions

ACS Appl. Mater. Interfaces 14 (2022) 44992

DOI

148.

T. Pohlmann, F. Bertram, J. Thien, J. Rodewald, K. Ruwisch, T. Kuschel, E. Weschke, K. Kuepper, J. Wollschläger

Structural and magnetic investigation of the interfaces of Fe3O4/MgO(001) with and without NiO interlayer

Phys. Rev. B 105 (2022) 235436

DOI

147.

K. Ruwisch, A. Alexander, T. Pollenske, K. Küpper, J. Wollschläger

Influence of oxygen plasma on the growth and stability of epitaxial NiCo2O4 ultrathin films on various substrates

Materials 15 (2022) 6911

DOI

146.

K. Ruwisch, T. Pohlmann, F. Bertram, C. Schlüter, A. Gloskovskii, K. Küpper, J. Wollschläger

Real-time monitoring the growth of epitaxial CoxFe3−xO4 ultrathin films on Nb-doped SrTiO3(001) via reactive molecular beam epitaxy by means of operando HAXPES

Materials 15 (2022) 2377

DOI

145.

H.D. Goldbach, J. Wollschläger

Evolving surface morphology during epitaxy of NiO on Ag(001)

J. Vac. Sci. Technol. A 40 (2022) 033403

DOI

144.

T. Pohlmann, M. Hoppe, J. Thien, A. Bikash Dey, A. Alexander, K. Ruwisch, O. Gutowski, J. Röh, A. Gloskovskii, C. Schlueter, K. Küpper, J. Wollschläger, F. Bertram

Time-resolved x-ray diffraction and photoelectron spectroscopy investigation of the reactive molecular beam epitaxy of Fe3O4 ultrathin films

Phys. Rev. B 105 (2022) 045412

DOI

143.

J. Thien, J. Bahlmann, A. Alexander, K. Ruwisch, J. Rodewald, T. Pohlmann, M. Hoppe, F. Alarslan, M. Steinhart, B. Altuncevahir, P. Shafer, C. Meyer, F. Bertram, J. Wollschläger, K. Küpper

Cationic ordering and its influence on the magnetic properties of co-rich cobalt ferrite thin films prepared by reactive solid phase epitaxy on Nb-doped SrTiO3(001)

Materials 15 (2022) 46

DOI

142.

J. Wollschläger, M.I. Larsson

Step barrier effects during early stages of the kinetic roughening of fcc(111) surfaces

Journal of Vacuum Science & Technology A 40 (2022) 013210

DOI

2021

141.

K. Ruwisch, T. Pohlmann, M. Hoppe, F. Bertram, P. Shafer, J. Wollschläger, K. Küpper

Interface magnetization phenomena in epitaxial thin Fe3O4/CoxFe3-xO4 bilayers

J. Phys. Chem. C 125 (2021) 23327

DOI

140.

L. Guo, J. Klein, J. Thien, M. Philippi, M. Haase, J. Wollschläger, M. Steinhart

Phenolic resin dual-use stamps for capillary stamping and decal transfer printing

ACS Appl. Mater. Interfaces 13 (2021) 49567

DOI

139.

G. Glavan, G.I.A. Belyaeva, K. Ruwisch, J. Wollschläger, M. Shamonin

Magnetoelectric response of laminated cantilevers comprising a magnetoactive elastomer and a piezoelectric polymer, in pulsed uniform magnetic fields

Sensors 21 (2021) 6390

DOI

138.

G. R. Hoogeboom, G.-J. N. Sint-Nicolaas, A. Alexander, O. Kuschel, J. Wollschläger, I. Ennen, B. J. van Wees, T. Kuschel

Role of NiO in the nonlocal spin transport through thin NiO films on Y3Fe5O12

Phys. Rev. B 103 (2021) 144406

DOI

137.

D. Graulich, J. Krieft, A. Moskaltsova, J. Demir, T. Peters, T. Pohlmann, F. Bertram, J. Wollschläger, J.R.L. Mardegan, S. Francoual, T. Kuschel

Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD

Appl. Phys. Lett. 118 (2021) 012407

DOI

2020

136.

T. Pohlmann, T. Kuschel, J. Rodewald, J. Thien, K. Ruwisch, F. Bertram, E. Weschke, P. Shafer, J. Wollschläger, K. Küpper

Cation- and lattice-site-selective magnetic depth profiles of ultrathin Fe3O4(001) films

Phys. Rev. B 102 (2020) 220411(R)

DOI

135.

J. Thien, J. Bahlmann, A. Alexander, M. Hoppe, T. Pohlmann, K. Ruwisch, C. Meyer, F. Bertram, K. Küpper, J. Wollschläger

Effects of post-deposition annealing on epitaxial CoO/Fe3O4 Bilayers on SrTiO3(001) and formation of thin high-quality Cobalt Ferrite-like films

J. Phys. Chem. C124 (2020) 23895

DOI

134.

J. Rodewald, J. Thien, T. Pohlmann, M. Hoppe, F. Bertram, K. Kuepper, J. Wollschläger

Real-time monitoring the growth of strained off-stochiometric NixFe3-xO4 ultrathin films on MgO(001)

Appl. Phys. Lett. 117 (2020) 011601

DOI

133.

J. Rodewald, J. Thien, K. Ruwisch, F. Bertram, K. Kuepper, J. Wollschläger

Enhanced magnetization of ultrathin NiFe2O4 films on SrTiO3(001) related to cation disorder and anomalous strain

Phys. Rev. Materials 4 (2020) 064404

DOI

132.

P. Thakur, V. Sharma, R. Sharma, J. Wollschläger, K. Ruwisch, A. Dahshan, S. Thakur, P. Sharma

Transformation in the structural and optical properties with the phase change from hematite (Fe2O3) to pure spinel structure in Mn-Zn nanoferrites

Physica B: Condensed Matter 584 (2020) 412107

DOI

2019

131.

J. Rodewald, J. Thien, T. Pohlmann, M. Hoppe, F. Timmer, F. Bertram, K. Kuepper, J. Wollschläger

Formation of ultrathin cobalt ferrite films by interdiffusion of Fe3O4/CoO bilayers

Phys. Rev. B 100 (2019) 155418

DOI

130.

M. Philippi, C.J. You, C.P. Richter, M. Schmidt, J. Thien, D. Liße, J. Wollschläger, J. Piehler, M. Steinhart

Close-packed silane nanodot arrays by capillary nanostamping coupled with heterocyclic silane ring opening

RSC Adv. 9 (2019) 24742

DOI

129.

R. Silber, O. Stejskal, L. Beran, P. Cejpek, R. Antos, T. Matalla-Wagner, J. Thien, O. Kuschel, J. Wollschläger, M. Veis, T. Kuschel, J. Hamrle

Quadratic magneto-optic Kerr effect spectroscopy of Fe epitaxial films on MgO(001) substrates

Phys. Rev. B 100 (2019) 0064403

DOI

2018

128.

R. Silber, M. Tomičková, J. Rodewald, J. Wollschläger, J. Pištora, M. Veis, T. Kuschel, J. Hamrle

Quadratic magnetooptic spectroscopy setup based on photoelastic light modulation

Photonics and Nanostructures- Fundamentals and Applications 31 (2018) 60

DOI

127.

O. Kuschel, N. Pathé, T. Schemme, K. Ruwisch, J. Rodewald, R. Buss, F. Bertram, T. Kuschel, K. Kuepper, J. Wollschläger

Impact of strain and morphology on magnetic properties of Fe3O4/NiO bilayers grown on Nb:SrTiO3(001) and MgO(001)

Materials 11 (2018) 1122

DOI

126.

H. Schäfer, K. Kuepper, M. Schmidt, K. Müller-Buschbaum, J. Stangl, D. Daum, M. Steinhart, C. Schulz-Kölbel, W.-J. Han, J. Wollschläger, U. Krupp, P.-L. Hou, X.-G. Liu

Steel-based electrocatalysts for efficient and durable oxygen evolution in acidic media

Catal. Sci. Techno. 8 (2018) 2104

DOI

125.

P. Rahe, E. F. Smith, J. Wollschläger, P. J. Moriarty

Formation routes and structural details of the CaF1 layer on Si(111) from high-resolution noncontact atomic force microscopy data

Phys. Rev. B 97 (2018) 125418

DOI

124.

J. Wollschläger

Structural Defects at Surfaces

in: G. Chiarotti, P. Chiaradia (Eds.) Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology – New Series, Group III: Condensed Matter, Vol. 45B, Physics of Solid Surfaces

Springer (2018) pp 151-382. ISBN: 978-3-662-53908-8

DOI

123.

J. Wollschläger

Reactive molecular beam epitaxy of iron oxide films: Strain, order, and interface properties

in: Encyclopedia of Interfacial Chemistry: Surface Science and Electrochemistry, vol. 3, ed. K. Wandelt,

Elsevier (2018), pp 284–296. ISBN: 9780 1280 97397

DOI

2017

122.

P. Bougiatioti, C. Klewe, D. Meier, O. Manos, O. Kuschel, J. Wollschläger, L. Bouchenoire, S.D. Brown, J.-M. Schmalhorst, G. Reiss, T. Kuschel

Quantitative disentanglement of the spin Seebeck, proximity-induced, ferromagnetic induced anomalous Nernst effect in normal-metal-ferromagnet  bilayers

Phys. Rev. Lett. 119 (2017) 227205

DOI

121.

H. Schäfer, K. Kuepper, K. Müller-Buschbaum, D. Daum, M. Steinhart, J. Wollschläger, U. Krupp, M. Schmidt, W. Han, J. Stangl

Electro-oxidation of a cobalt based steel in LiOH: a non-noble metal based electro-catalyst suitable for durable water-splitting in an acidic milieu

Nanoscale 9 (2017) 17829

DOI

120.

F. Timmer, J. Bahlmann, J. Wollschläger

On the diffraction pattern of bundled rare-earth silicide nanowires on Si(001)

J. Phys.: Condens. Matter 111 (2017) 041902

DOI

119.

A. Kadari, T. Schemme, D. Kadri, J. Wollschläger

XPS and morphological properties of Cr2O3 thin films grown by thermal evaporation method

Results in Physics 7 (2017) 3124

DOI

118.

O. Kuschel, W. Spiess, T. Schemme, J. Rubizo-Zuazo, K. Kuepper, J. Wollschläger

Real-time monitoring of the structure of ultrathin Fe3O4 films during growth on Nb-doped SrTiO3(001)

Appl. Phys. Lett. 111 (2017) 041902

DOI

117.

F. Timmer and J. Wollschläger

Effects of domain boundaries on the diffraction patterns of one-dimensional structures

Condens. Matter 2 (2017) 7

DOI

2016

116.

F. Timmer, R.Oelke, C. Dues, S. Sanna, W.G. Schmidt, M. Franz, S. Appelfeller, M. Dähne, J. Wollschläger

Strain induced quasi-one-dimensional rare-earth silicide structures on Si(111)

Phys. Rev. B94 (2016) 205431

DOI

115.

O. Kuschel, R. Buß, W. Spiess, T. Schemme, J. Wöllermann, K. Balinski, A.T. N'Diaye, T. Kuschel, J. Wollschläger, K. Kuepper

From Fe3O4/NiO bilayers to NiFe2O4-like thin films through Ni interdiffusion

Phys. Rev. B94 (2016) 094423

DOI

114.

H. Schäfer, D.M. Chevrier, K. Kuepper, P. Zhang, J. Wollschläger, D. Daum, M. Steinhart, C. Heß, U. Krupp, K. Müller-Buschbaum, J. Stangl, M. Schmidt

X20CoCrWMo10-9//Co3O4: a metal-ceramic composite with unique efficiency values for water-splitting in the neutral regime

Energy Environ. Sci., 9 (2016) 2609

DOI

113.

H. Schäfer, D.M. Chevrier, P. Zhang, J. Stangl, K. Müller-Buschbaum, J.D. Hardege, K. Kuepper, J. Wollschläger, U. Krupp, S. Dühnen, M. Steinhart, L. Walder, S. Sadaf, M. Schmidt

Electro-Oxidation of Ni42 Steel: A Highly Active Bifunctional Electrocatalyst

Adv. Funct. Mater. 26 (2016) 6402

DOI

112.

K. Kuepper, O. Kuschel, N. Pathe, T. Schemme, J.-M. Schmalhorst, A. Thomas, E. Arenholz, M. Gorgoi, R. Ovsyannikov, S. Bartkowski, G. Reiss, J. Wollschläger

Electronic and magnetic structure of epitaxial Fe3O4(001)/NiO heterostructures grown on MgO(001) and Nb-doped SrTiO3(001)

Phys. Rev. B 94 (2016) 024401

DOI

111.

C. Klewe, T. Kuschel, J.-M. Schmalhorst, F. Bertram, O. Kuschel, J. Wollschläger, J. Strempfer, M. Meinert, G. Reiss

Static magnetic proximity effect in Pt/Ni1-xFex bilayers investigated by x-ray resonant magnetic reflectivity

Phys. Rev. B 93 (2016) 214440

DOI

110.

S. Sanna, C. Dues, W.G. Schmidt, F. Timmer, J. Wollschläger, M. Franz, S. Appelfeller, M. Dähne

Rare-earth silicide thin films on the Si(111) surface

Phys. Rev. B93 (2016) 195407

DOI

109.

L. Schneider, T. Rinkel, B. Voß, A. Chrobak, J.P. Klare, J. Neethling, L. Olivier, D. Schaniel, E.-E. Bendeif, F. Bondino, E. Magnano, I. Pis, K. Balinski

J. Wollschläger, H.-J. Steinhoff, M. Haase, K. Kuepper, Characterization of multifunctional β-NaEuF4/NaGdF4 core-shell nanoparticles with narrow size distribution

Nanoscale 8 (2016) 2832

DOI

108.

T. Nordmann, O. Kuschel, J. Wollschläger

Epitaxial growth of ultrathin MgO layers on Fe3O4(001) films

Appl. Surf. Sci. 381 (2016) 28

DOI

107.

J. Wollschläger, T. Schemme, O. Kuschel, M. Witziok, T. Kuschel, K. Kuepper

Structural, magnetic and magneto optical properties of Fe3O4/NiO bilayers on MgO(001)

in: Oxide-based Materials and Devices VII, eds. F.H. Teherani, D.C. Look, D.J. Rogers, Proc. SPIE 9749 (2016) 974917

DOI

106.

T. Kuschel, C. Klewe, P. Bougiatioti, O. Kuschel, J. Wollschläger, L. Bouchenoire, S.D. Brown., J.-M. Schmalhorst, D. Meier, G. Reiss

Static magnetic proximity effect in Pt layers on sputter-deposited NiFe2O4 and on Fe of various thicknesses investigated by XRMR

Transact. Magnet. 52 (2016) 4500104

DOI

2015

105.

H. Schäfer, S. Sadaf, L. Walder, K. Kuepper, S. Dinklage, J. Wollschläger, L. Schneider, M. Steinhart, J. Hardege, D. Daum

Stainless steel made to rust: A robust water-splitting catalyst with benchmark characteristics

Energy Environ. Sci. 8 (2015) 2685

DOI

104.

H. Schäfer, K. Kuepper, J. Wollschläger, N. Kashaev, J. Hardege, L. Walder, S.M. Beladi-Mousavi, B. Hartmann-Azanza, M. Steinhart, S. Sadaf, F. Dorn

Oxidized Mild Steel S235: An efficient anode for electrocatalytically initiated water splitting

Chem. Sus. Chem. 8 (2015) 3099

DOI

103.

G. Niu, M.H. Zoellner, T. Schroeder, A. Schaefer, J.-H. Jhang, V. Zielasek, M. Bäumer, H. Wilkens, J. Wollschläger, R. Olbrich, C. Lammers, M. Reichling

Controlling the physics and chemistry of binary and ternary praseodymium and cerium oxide systems

Phys. Chem. Chem. Phys. 17 (2015) 24513

DOI

102.

T. Schemme, A. Krampf, F. Bertram, T. Kuschel, K. Kuepper, J. Wollschläger

Modifying magnetic properties of ultra-thin magnetite films by growth on Fe pre-covered MgO(001)

J. Appl. Phys. 118 (2015) 113904

DOI

101.

O. Kuschel, F. Dieck, H. Wilkens, S. Gevers, J. Rodewald, C. Otte, M.H. Zoellner, G. Niu, T. Schroeder, J. Wollschläger

Plasma enhanced complete oxidation of ultrathin epitaxial praseodymia films on Si(111)

Materials 8 (2015) 6379

DOI

100.

T. Schemme, O. Kuschel, F. Bertram, K. Kuepper, J. Wollschläger

Structure and morphology of epitaxially grown Fe3O4/NiO bilayers on MgO(001)

Thin Solid Films 589 (2015) 526

DOI

99.

T. Kuschel, C. Klewe, J.-M. Schmalhorst, F. Bertram, O. Kuschel, T. Schemme, J. Wollschläger, S. Francoual, J. Strempfer, A. Gupta, M. Meinert, G. Götz, D. Meier, G. Reiss

Static magnetic proximity effect in Pt/NiFe2O4 and Pt/Fe bilayers investigated by x-ray resonant magnetic reflectivity

Phys. Rev. Lett. 115 (2015) 097401

DOI

98.

A. Thomas, S. Niehörster, S. Fabretti, N. Shepheard, O. Kuschel, K. Kuepper, J. Wollschläger, P. Krzysteczko, E. Chicca

Tunnel junction based memristors as artificial synapses

Front. Neurosci. 9 (2015) 241

DOI

97.

H. Wilkens, W. Spieß, M. H. Zoellner, G. Niu, T. Schroeder, J. Wollschläger

Post deposition annealing of epitaxial Ce1-xPrxO2-δ films grown on Si(111)

Phys. Chem. Chem. Phys. 17 (2015) 9991

DOI

96.

L. Marnitz, K. Rott, S. Niehörster, C. Klewe, D. Meier, S. Fabretti, M. Witziok, A. Krampf, O. Kuschel, T. Schemme, K. Kuepper, J. Wollschläger, A. Thomas, G. Reiss, T. Kuschel

Sign change in the tunnel magnetoresistance of Fe3O4/MgO/Co-Fe-B magnetic tunnel junctions depending on the annealing temperature and the interface treatment

AIP Advances 5 (2015) 047103

DOI

95.

H. Schäfer, S.M. Beladi-Mousavi, L. Walder, J. Wollschläger, O. Kuschel, S. Ichilmann, S. Sadaf, M. Steinhart, K. Kuepper, L. Schneider

Surface oxidation of stainless steel: Oxygen evolution electrocatalysts with high catalytic activity

ACS Catalysis 5 (2015) 2671

DOI

94.

T. Lichtenstein, H. Teiken, H. Pfnür, J. Wollschläger, C. Tegenkamp

Au-chains grown on Ge(100): A detailed SPA-LEED study

Surf. Sci. 632 (2015) 64

DOI

93.

T. Schemme, N. Pathé, G. Niu, F. Bertram, T. Kuschel, K. Kuepper, J. Wollschläger

Magnetic anisotropy related to strain and thickness of ultrathin iron oxide films on MgO(001)

Mater. Res. Express 2 (2015) 016101

DOI

2014

92.

D. Bruns, I. Kiesel, S. Jentsch, S. Lindemann, C. Otte, T. Schemme, T. Kuschel, J. Wollschläger

Structural analysis of FeO(111)/Ag(001): Undulation of hexagonal oxide monolayers due to square lattice metal substrates

J. Phys.: Condens. Matter. 26 (2014) 315001

DOI

91.

J.I. Flege, B. Kaemena, J. Hoecker, F. Bertram, J. Wollschlaeger, T. Schmidt, J. Falta

Ultrathin, epitaxial cerium dioxide on silicon

Appl. Phys. Lett 104 (2014) 131604

DOI

90.

R. Olbrich, H.H. Pieper, R. Oelke, H. Wilkens, J. Wollschläger, M.H. Zoellner, T. Schroeder,  M. Reichling

A well-structured metastable ceria surface

Appl. Phys. Lett. 104 (2014) 081910

DOI

89.

H. Wilkens, S. Gevers, S. Röhe, A. Schaefer, M. Bäumer, M.H. Zoellner, T. Schroeder, J. Wollschläger

Structural changes of ultrathin cub-PrO2(111)/Si(111) films due to thermally induced oxygen desorption

J. Phys. Chem. C 118 (2014) 3056

DOI

2013

88.

H. Wilkens, O. Schuckmann, R. Oelke, S. Gevers, M. Reichling, A. Schaefer, M. Bäumer, M.H. Zoellner, G. Niu, T. Schroeder, J. Wollschläger

Structural transitions of epitaxial ceria films on Si(111)

Phys. Chem. Chem. Phys. 15 (2013) 18599

DOI

87.

D. Bruns, S.R. Lindemann, K. Kuepper, T. Schemme, J. Wollschläger

Fe3O4 films on Ag(001)-Generation of high-quality epitaxial ferrimagnetic metal oxide films

Appl. Phys. Lett 103 (2013) 052401

DOI

86.

F. Bertram, C. Deiter, T. Schemme, S. Jentsch, J. Wollschläger

Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)

J. Appl. Phys. 113 (2013) 184103

DOI

85.

H. Wilkens, J. Rodewald, S. Gevers, M.H. Zoellner, T. Schroeder, J. Wollschläger

Surface morphology of ultrathin hex-Pr2O3 films on Si(111)

J. Phys. D: Appl. Phys. 46 (2013) 285306

DOI

84.

H. Wilkens, O. Schuckmann, R. Oelke, S. Gevers, A. Schaefer, M. Bäumer, M.H. Zoellner, T. Schroeder, J. Wollschläger

Stabilization of the ceria ι-phase (Ce7O12) surface on Si(111)

Appl. Phys. Lett. 102 (2013) 111602

DOI

2012

83.

T. Kuschel, J. Hamrle, J. Pistora, K. Saito, S. Bosu, Y. Sakuraba, K. Takanashi, J. Wollschläger

Magnetic characterization of thin Co50Fe50 films by magnetooptic Kerr effect

J. Phys. D: Appl. Phys. 45 (2012) 495002

DOI

82.

M.H. Zoellner, P. Zaumseil, H. Wilkens, S. Gevers, J. Wollschläger, M. Bäumer, Y.-H. Xie, G. Niu, T. Schroeder

Stoichiometry-structure correlation of epitaxial Ce1-xPrxO2-δ (x=0-1) thin films on Si(111)

J. Cryst. Growth 355 (2012) 159

DOI

81.

F. Bertram, C. Deiter, O. Hoefert, T. Schemme, F. Timmer, M. Suendorf, B. Zimmermann, J. Wollschläger

X-ray diffraction study on size effects in epitaxial magnetite thin films on MgO(001)

J. Phys. D: Appl. Phys. 45 (2012) 395302

DOI

80.

T. Kuschel, J. Hamrle, J. Pistora, K. Saito, S. Bosu, Y. Sakuraba, K. Takanashi, J. Wollschläger

Magnetization reversal analysis of a thin B2-type ordered Co50Fe50 film by magnetooptic Kerr effect

J. Phys. D: Appl. Phys. 45 (2012) 205001

DOI

79.

M.H. Zoellner, J. Dabrowski, P. Zaumseil, A. Giussani, M.A. Schubert, G. Lupina, H. Wilkens, J. Wollschläger, M. Reichling, M. Bäumer, T. Schroeder

Stacking behavior of twin-free type-B oriented CeO2(111) films on hexagonal Pr2O3(0001)/Si(111) systems

Phys. Rev. B85 (2012) 035302

DOI

2011

78.

J.I. Flege, B. Kaemena, S. Gevers, F. Bertram, T. Wilkens, D. Bruns, J. Bätjer, T. Schmidt, J. Wollschläger, J. Falta

Silicate-free growth of high-quality ultrathin cerium oxide films on Si(111)

Phys. Rev. B84 (2011) 235418

DOI

77.

F. Bertram, C. Deiter, K. Pflaum, M. Suendorf, C. Otte, J. Wollschläger

In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ulta-thin iron oxide films

J. Appl. Phys. 110 (2011) 102208

DOI

76.

J. Wollschläger, C. Deiter, C.R. Wang, B.H. Müller, K.R. Hofmann

Surfactant enhanced solid phase epitaxy of Ge/CaF2/Si(111): Synchrotron x-ray characterization of structure and morphology

J. Appl. Phys. 110 (2011) 102205

DOI

75.

S. Gevers, T. Weisemoeller, A. Schaefer, V. Zielasek, M. Bäumer, J. Wollschläger

Structure of oxygen-plasma-treated ultrathin praseodymia films on Si(111)

Phys. Rev. B83 (2011) 193408

DOI

74.

T. Kuschel, H. Bardenhagen, H. Wilkens, R. Schubert, J. Hamrle, J. Pistora, J. Wollschläger

Vectorial magnetometry using magnetooptic Kerr effect including first- and second-order contributions for thin ferromagnetic films

J. Phys. D: Appl. Phys.44 (2011) 265003

DOI

73.

T. Kuschel, T. Becker, D. Bruns, M. Suendorf, F. Bertram, P. Fumagalli, J. Wollschläger

Uniaxial magnetic anisotropy for thin Co films on glass studied by magnetooptic Kerr effect

J. Appl. Phys. 109 (2011) 093907

DOI

72.

D. Bruns, S. Gevers, J. Wollschläger

Formation and Morphology of Step Bunches during B-Segregation on vicinal Si(111)

Surf. Sci. 605 (2011) 861

DOI

71.

A. Schaefer, S. Gevers, V. Zielasek, T. Schroeder, J. Falta, J. Wollschläger, M. Bäumer

Photoemission study of praseodymia in its highest oxidation state: The necessity of in situ plasma treatment

J. Chem. Phys. 134 (2011) 054701

DOI

70.

S. Gevers, T. Weisemoeller, D. Bruns, A. Giussani, T. Schroeder, J. Wollschläger

Post-deposition annealing of praseodymia films on Si(111) at low temperatures

J. Phys.: Condens. Matter 23 (2011) 115904

DOI

2010

69.

A. Moses Ezhil Raj, V. Agnes, V.B. Jothy, C. Ravidhas, J. Wollschläger, M. Suendorf, M. Neumann, M. Jayachandran, C. Sanjeeviraja

Spray deposition and property analysis of anatase phase titania (TiO2) nanostructures

Thin Solid Films 519 (2010) 129

DOI

68.

S. Gevers, J.I. Flege, B. Kaemena, D. Bruns, T. Weisemoeller, J. Falta, J. Wollschläger

Improved epitaxy of ultrathin praseodymia films on chlorine passivated Si(111) reducing silicate interface formation

Appl. Phys. Lett. 97 (2010) 242901

DOI

67.

C. Deiter, M. Bierkandt, A. Klust, C. Kumpf, Y. Su, O. Bunk, R. Feidenhans’l; J. Wollschläger

Structural transitions and relaxation processes during the epitaxial growth of ultrathin CaF2 films on Si(111)

Phys. Rev. B82 (2010) 085449

DOI

66.

A. Moses Ezhil Raj, S.G. Victoria, V.B. Jothy, C. Ravidhas, J. Wollschläger, M. Suendorf, M. Neumann, M. Jayachandran, C. Sanjeeviraja

XRD and XPS characterization of mixed valence Mn3O4 hausmannite thin films prepared by chemical spray pyrolysis technique

Appl. Surf. Sci. 256 (2010) 2920

DOI

65.

S. Gevers, T. Weisemoeller, B. Zimmermann, C. Deiter, J. Wollschläger

Structure and stability of cub-Pr2O films on Si(111) under post deposition annealing conditions

Phys. Status Solidi C 7 (2010) 292

DOI

2009

64.

S. Gevers, T. Weisemoeller, B. Zimmermann, F. Bertram, C. Deiter, J. Wollschläger

Structual phase transition of ultra thin PrO2 films on Si(111)

J.Phys.: Condens.Matter 21 (2009) 175408

DOI

63.

A. Giussani, P. Zaumseil, P. Rodenbach, G. Weidner, M.A. Schubert, D. Geiger, H. Lichte, P. Storck, J. Wollschläger, T. Schroeder

Defect structure of Ge(111)/cubic Pr2O3(111)/ Si(111) heterostructure: Thickness and annealing dependence

J. Appl. Phys. 106 (2009) 073502

DOI

62.

G. Jnawali, H. Hattab, C.A. Bobisch, A. Bernhart, E. Zubkov, C. Deiter, T. Weisemoeller, F. Bertram, J. Wollschläger, R. Möller, M. Horn-von Hoegen

Epitaxial Growth of Bi(111) on Si(001)

 e-J. Surf. Sci. Nanotec 7 (2009) 441

DOI

61.

A. Schaefer, V. Zielasek, T. Schmidt, A. Sandell, M. Schowalter, O. Seifarth, L.E. Walle, Ch. Schulz, J. Wollschläger, T. Schroeder, A. Rosenauer, J. Falta, M. Bäumer

Growth of praseodymium oxide on Si(111) under oxygen-deficient conditions

Phys. Rev. B80 (2009) 045414

DOI

60.

T. Weisemoeller, F. Bertram, S. Gevers, C. Deiter, A. Greuling, J. Wollschläger

Effect of amorphous interface layers on crystalline thin-film x-ray diffraction

Phys. Rev. B79 (2009) 245422

DOI

59.

A. Giussani, P. Rodenbach, P. Zaumseil, J. Dabrowski, R. Kurps, G. Weidner, H.-J. Müssig, P. Storck, J. Wollschläger, T. Schroeder

Publisher's Note: “Atomically smooth and single crystalline Ge(111)/cubic-Pr2O3(111)/Si(111) heterostructures: Structural and chemical composition study”

J. Appl. Phys. 105 (2009) 129905

DOI

58.

T. Weisemoeller, F. Bertram, S. Gevers, A. Greuling, C. Deiter, H. Tobergte, M. Neumann, J. Wollschläger, A. Giussani, T. Schroeder

Post deposition annealing induced transition from hexagonal Pr2O3 to cubic PrO2 films on Si(111)

J. Appl. Phys. 105 (2009) 124108

DOI

57.

A. Giussani, P. Rodenbach, P. Zaumseil, J. Dabrowski, R. Kurps, G. Weidner, H.-J. Müssig, P. Storck, J. Wollschläger, T. Schroeder

Atomically smooth and single crystalline Ge(111)/cubic-Pr2O3(111)/Si(111) heterostructures: Structural and chemical composition study

J. Appl. Phys. 105 (2009) 033512

DOI

2008

56.

T. Weisemoeller, C. Deiter, F. Bertram, S. Gevers, A. Giussani, P. Zaumseil, T. Schroeder, J. Wollschläger

Epitaxy of single crystalline PrO2 films on Si(111)

 Appl. Phys. Lett. 93 (2008) 032905

DOI

55.

A. Giussani, O. Seifarth, P. Rodenbach, H.-J. Müssig, P. Zaumseil, T. Weisemoeller, C. Deiter, J. Wollschläger, P. Storck, T. Schroeder

The influence of lattice oxygen on the initial growth behavior of heteroepitaxial Ge layers on single crystalline PrO2(111)/Si(111)support systems

J. Appl. Phys. 103 (2008) 084110

DOI

54.

A. Moses Ezhil Raj, V. Senthilkumar, V. Swaminathan, J. Wollschläger, M. Suendorf, M. Neumann, M. Javachandran, C. Sanjeeviraja

Studies on transparent spinel magnesium indium oxide thin films prepared by chemical spray pyrolysis

Thin Solid Films (2008) 517

DOI

2007

53.

E.P. Rugeramigabo, C. Deiter, J. Wollschläger

Solid phase epitaxy of Ge films on CaF2/Si(111)

Appl. Surf. Sci. 254 (2007) 143

DOI

52.

J. Wollschläger, C. Tegenkamp

Diffraction from disordered vicinal surfaces with alternating terraces

Phys. Rev. B75 (2007) 245439

DOI

2006

51.

J. Wollschläger, C. Deiter, M. Bierkandt, A. Gerdes, M. Bäumer, C.R. Wang, B.H. Müller, K.R. Hofmann

Homogeneous Si films on CaF2/Si(111) due to boron enhanced solid epitaxy

Surf. Sci. 600 (2006) 3637

DOI

50.

T. Nowitzki, P. Nickut, C. Deiter, J. Wollschläger, K. Al-Shamery, M. Bäumer

Au deposits on graphite: On the nature of high temperature desorption peaks in CO thermal desorption spectra

Surf. Sci. 600 (2006) 3595

DOI

49.

A. Klust, Q. Yu, M.A. Olmstead, T. Ohta, F.S. Ohuchi, M. Bierkandt, C. Deiter, J. Wollschläger

Contrast in Scanning Probe Microscopy Images of Ultrathin Insulator Films

Appl. Phys. Lett. 88 (2006) 063107

DOI

2003

48.

A. Klust, M. Grimsehl, J. Wollschläger

Interface-reaction-mediated formation of two-dimensional Si islands on CaF2

Appl. Phys. Lett. 82 (2003) 4483

DOI

47.

J. Wollschläger, M. Bierkandt, M.I. Larsson

Kinetic phase diagram for terrace and step nucleation of CaF/Si (111)

Appl. Surf. Sci. 219 (2003) 107

DOI

46.

B.H. Müller, C.R. Wang, K.R. Hofmann, M. Bierkandt, C. Deiter, J. Wollschläger

Initial stages of CaF2/Si(111) epitaxy investigated by friction force microscopy

Surf. Sci. 532-535 (2003) 633

DOI

45.

A. Petkova, J. Wollschläger, H.-L. Günter, M. Henzler

Deviations from exact epitaxial positions in heteroepitaxy

Surf. Sci. 542 (2003) 211

DOI

2002

44.

J. Wollschläger

Resonant tunneling devices based on epitaxial insulator-semiconductor structures: growth and characterisation of CaF2 films on Si(111)

in: Recent Research Developments in Applied Physics,  Vol. 5-II, ed. S.G. Pandalai (Transworld Research Network, Trivandrum, India, 2002) pp. 621-695.   

43.

J. Wollschläger

Substrate-step-induced effects on the growth of CaF2 on Si(111)

Appl. Phys. A 75 (2002) 155

DOI

42.

A. Klust, M. Bierkandt, J. Wollschläger, B.H. Müller, T. Schmidt, J. Falta

Low-temperature interface structure of CaF2/Si(111) studied by combining X-ray standing waves with component-resolved photoemission

Phys. Rev. B65 (2002) 193404

DOI

41.

C. Tegenkamp, J. Wollschläger, H. Pfnür, F.-J. Meyer zu Heringdorf, M. Horn-von Hoegen

Step and kink correlations on vicinal Ge(100) surfaces investigated by electron diffraction

Phys. Rev. B65 (2002) 235316

DOI

2001

40.

A. Petkova, J. Wollschläger, H.-L. Günter, M. Henzler

Formation and commensurate analysis of „incommensurate“ superstructures of Pb on Si(111)

Surf. Sci. 471 (2001) 11

DOI

39.

J. Wollschläger, D. Erdös, H. Goldbach, R. Höpken, K.-M. Schröder

Growth of NiO and MgO films on Ag(100)

Thin Solid Films 400 (2001) 1

DOI

38.

A. Petkova, J. Wollschläger, H.-L. Günter, M. Henzler

Order and disorder in ultrathin Pb films grown on Si(111)7x7 substrates at low temperature

Surf. Sci. 482-485 (2001) 922

DOI

2000

37.

A.A. Saranin, V.G. Lifshits, K.V. Ignatovich, H. Bethge, R. Kayser, H. Goldbach, A. Klust, J. Wollschläger, M. Henzler

Restructuring process of the Si(111) surface upon Ca deposition

DOI

Surf. Sci. 448 (2000) 87

36.

J. Wollschläger, T. Schmidt, M. Henzler, M.I. Larsson

Determination of diffusion energies on face-centered cubic (111) surfaces from diffraction experiments: A Monte Carlo study

Surf. Sci. 454-456 (2000) 566

DOI

35.

A. Klust, R. Kayser, J. Wollschläger

Growth kinetics of CaF2/Si(111) for a two step deposition

Phys. Rev. B62 (2000) 2158

DOI

34.

J. Wollschläger, T. Hildebrandt, R. Kayser, J. Viernow, A. Klust, J. Bätjer, A. Hille, T. Schmidt, J. Falta

Effects of electron irradiation on the structure and morphology of CaF2/Si(111)

Appl. Surf. Sci. 162/163 (2000) 309

DOI

1999

33.

C. Tegenkamp, M. Michailov, J. Wollschläger, H. Pfnür

Growth and surface alloy formation of Mg on Ag(100)

Appl. Surf. Sci. 151 (1999) 40

DOI

32.

J. Wollschläger, J. Viernow, C. Tegenkamp, D. Erdös, K.-M. Schröder, H. Pfnür

Stoichiometry and morphology of MgO films grown reactively on Ag(100)

Appl. Surf. Sci. 142 (1999) 129

DOI

31.

A. Petkova, J. Wollschläger, H.-L. Günter, M. Henzler

Formation of intermediate 3x3 phase from Pb on Si(111) at high temperature

J. Phys.: Condens. Matter 11 (1999) 9925

DOI

30.

C. Tegenkamp, H. Pfnür, W. Ernst, U. Malaske, J. Wollschläger, D. Peterka,
K.-M. Schröder, V. Zielasek, M. Henzler

Defects in epitaxial insulating thin films

J. Phys.: Condens. Matter 11 (1999) 9943

DOI

1998

29.

J. Wollschläger, H. Pietsch, R. Kayser, A. Klust

Annealing of CaF2 adlayers grown on Si(111): Investigations of the morphology by atomic force microscopy

Thin Solid Films 336 (1998) 120

DOI

28.

J. Wollschläger

Morphology and defect characterization of epitaxial oxide films

Defect and Diffusion Forum 164 (1998) 37

DOI

27.

J. Wollschläger, M.I. Larsson

Diffraction from two-dimensional vicinal surfaces with non-colliding meandering steps

Phys. Rev. B57 (1998) 14937

DOI

26.

J. Wollschläger, E.Z. Luo, M. Henzler

Diffraction characterization of rough films formed under stable and unstable growth conditions

Phys. Rev. B57 (1998) 15541

DOI

25.

M. Henzler, V. Zielasek, D. Erdös, J. Wollschläger

Epitaxial insulating films

Surf. Rev. Lett. 5 (1998) 675

DOI

24.

B. Müller, L.P. Nedelmann, B. Fischer, H. Brune, J.V. Barth, K. Kern, D. Erdös, J. Wollschläger

Strain relief via island ramification in submonolayer heteroepitaxy

Surf. Rev. Lett. 5 (1998) 769

DOI

23.

J. Wollschläger, A. Klust, H. Pietsch

Inhomogeneous growth of CaF2 adlayers on Si(111) at intermediate temperatures

Appl. Surf. Sci. 123/124 (1998) 496

DOI

22.

J. Wollschläger, D. Erdös, K.M. Schröder

The formation of mosaics during the reactive growth of MgO films on Ag(100)

Surf. Sci. 402-404 (1998) 272

DOI

21.

J. Wollschläger, H. Pietsch, A. Klust

Competition between terrace and step nucleation: epitaxy of CaF2 on vicinal Si(111) studied by atomic force microscopy

Appl. Surf. Sci. 130-132 (1998) 29

DOI

20.

A. Klust, H. Pietsch, J. Wollschläger

Growth of CaF2 on Si(111): Imaging of the CaF interface by friction force microscopy

Appl. Phys. Lett. 73 (1998) 1967

DOI

19.

J. Wollschläger, F. Schäfer, M. Schröder

Diffraction spot profile analysis for vicinal surfaces with long-range order

Surf. Sci. 396 (1998) 94

DOI

1997

18.

H. Pietsch, A. Klust, A. Meier, J. Wollschläger

Growth instabilities of CaF2 adlayers deposited at high temperature on Si(111)

Surf. Sci. 377-379 (1997) 909

DOI

17.

F. Schäfer, D. Erdös, K.M. Schröder, L. Nedelmann, B. Müller, B. Fischer, K. Kern, M. Henzler, J. Wollschläger

Epitaxial growth of Mg on Pd(100) and Ag(100): Growth modes for complete and incomplete adlayer condensation

in: Surface Diffusion: Atomistic and Collective Processes, ed. M. Tringides, Plenum Press, New York, 1997. ISBN: 978-1-4899-0262-7

DOI

16.

M.I. Larsson, H. Frischat, J. Wollschläger, M. Tringides

Properties of kinks in vicinal face-centered cubic (111) surfaces

Surf. Sci. 381 (1997) 123

DOI

15.

L. Nedelmann, B. Müller, B. Fischer, K. Kern, D. Erdös, J. Wollschläger, M. Henzler

A comparative STM and SPA-LEED study on the evolution of strain induced stripe pattern on Cu/Ni(100)

Surf. Sci. 376 (1997) 113

DOI

14.

J. Wollschläger

Simple analysis of spot splitting due to diffraction at surfaces with atomic steps

Surf. Sci. 383 (1997) 103

DOI

13.

M.I. Larsson, M. Tringides, H. Frischat, J. Wollschläger

Thermal roughening of uncorrelated steps

Surf. Sci. 387 (1997) 142

DOI

1996

12.

J. Wollschläger, A. Meier

Diffraction spot profile analysis for heteroepitaxial surfaces applied to the initial growth stages of CaF2 adlayers on Si(111)

Appl. Surf. Sci. 104/105 (1996) 392

DOI

11.

J. Wollschläger, A. Meier

Film and interface morphology of CaF2 Grown on Si(111) at low temperature

J. Appl. Phys. 79 (1996) 7373

DOI

1995

10.

E.Z. Luo, J. Wollschläger, F. Wegner, M. Henzler

SPA-LEED studies of growth of Ag on Ag(111) at low temperatures

Appl. Phys. A60 (1995) 19

DOI

9.

J. Wollschläger

Diffraction from surfaces with randomly distributed structural defects

Surf. Sci. 328 (1995) 325

DOI

8.

M. Henzler, C. Homann, U. Malaske, J. Wollschläger

Misfit accomodation in heteroepitaxy by inclined stacking faults

Phys. Rev. B52 (1995) R17060®

DOI

1994

7.

E.Z. Luo, S. Heun, M. Kennedy, J. Wollschläger, M. Henzler

Surface roughness and conductivity of thin Ag films

Phys. Rev. B49 (1994) 4858

DOI

1992

6.

J. Wollschläger, N.M. Amer

Heterogeneous nucleation and epitaxial growth of Au on the Co decorated Au(111) surface investigated by scanning tunneling microscopy

Surf. Sci. 277 (1992) 1

DOI

1991

5.

J. Wollschläger, E.Z. Luo, M. Henzler

Thermal roughness of the homogeneous and inhomogeneous Cu(311) surface studied by high-resolution low-energy electron diffraction

Phys. Rev. B44 (1991) 13031

DOI

4.

J. Wollschläger, E.Z. Luo, M. Henzler

Epitaxial growth and thermal behaviour of pb overlayers on Cu(311) studied by high-resolution low-energy electron diffraction

Surf. Sci. 257 (1991) 274

DOI

1990

3.

J. Wollschläger, J. Falta, M. Henzler

Electron diffraction at stepped homogeneous and inhomogeneous surfaces

Appl. Phys. A50 (1990) 57

DOI

2.

G. Meyer, J. Wollschläger, M. Henzler

Epitaxial growth of thin copper layers on Cu(111) studied by high-resolution low-energy electron diffraction

Surf. Sci. 231 (1990) 64

DOI

1989

1.

J. Wollschläger, M. Henzler

Defects at the Si(111)/SiO2 interface investigated with low-energy electron diffraction

Phys. Rev. B39 (1989) 6052

DOI